Rick Mugridge


Very special thanks to Jackie Tyrrell and Anna Tyrrell for encouragement, feedback, and support through the writing process.

Many thanks to Dave Mugridge for feedback and encouragement. Thanks to Ewan Tempero for writing the original Chat server tests that ended up in Fit, for help with the Sokoban example, and for discussions about approaches to Web testing. Thanks to John Hamer for introducing me to Dot and PSTricks and for help with obscure LaTex issues. Thanks to Ian Mitchell for stressing the importance of testing the essence of business rules. Thanks to Sharron of McEntee Party Hire, Papakura, for background information on the business of renting party items.

Thanks to Robert Ensor and the students of SOFTENG 306 at the University of Auckland, who built the PartyHire system in a third-year group project in 2004, based on Fit tests that I supplied. Their questions helped me to tune my thinking about expressing and refining business rules as tests.

Thanks for discussions and help from Frank Westphal, Joshua Kerievsky, Micah Martin, David Hussman, Angela Martin, and Diana Larsen. Thanks to good feedback from the participants at the XP2004, ADC2004, and XPAU 2004 Fit tutorials. Thanks to Geoff Bache and Jennitta Andrea for discussions about testing frameworks. Thanks to Hubert Baumeister for sharing his experience in using Fit tests in his project class. Thanks to the members of the AgileAuckland group, and its predecessor, for lots of good discussions about agility.

Thanks to the University of Auckland for the half-year sabbatical in 2003, which allowed me time for attending conferences and for the initial writing.

Many thanks to Ward Cunningham, my coauthor, for creating Fit, such a powerful and elegant tool. Thanks also to Fit enthusiasts Jim Shore, John Roth, Micah Martin, Robert C. Martin, Chris Wheeler, Friedrich Brunzema, and others on the fit-dev email group for many interesting discussions about Fit and its evolution.

Special thanks to Brian Marick, whose clear thinking on the role of business-facing tests is inspiring.



    Fit for Developing Software. Framework for Integrated Tests
    Fit for Developing Software: Framework for Integrated Tests
    ISBN: 0321269349
    EAN: 2147483647
    Year: 2005
    Pages: 331

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