2.6 References

   

1. J. Bergeron. Writing Testbenches . Norwell, MA: Kluwer Academic Publishers, 2000.

2. www.cis.ohiostate.edu/~harrold/research/regression_testing.htm

3. M. J. S. Smith. Application-Specific Integrated Circuits . Reading, MA: Addison-Wesley, 1997.

4. D. Hsu. "DFT Closure in SOC Design." Synopsys, Inc., Mountain View, CA, 2000.

5. J. Desposito. "SOC and Deep-Submicron Technology Drive New DFT Strategies." Electronic Design, 1998.

6. "JTAG Boundary Scan Testing." Testability Primer, Texas Instruments, 1997.

7. B. Murray and J. Hayes. "Testing IC's: Getting to the Core of the Problem," Computer , Vol. 29, No. 11, IEEE, November 1996.

8. A. Crouch. Design for Test . Upper Saddle River, NJ: Prentice Hall, 1999.

9. "Solving the Challenges of Testing Small Embedded Cores and Memories Using FastScan Macro Test." Mentor Graphics, 2000.

10. M. Keating and P. Bricaud. Reuse Methodology Manual for System-on-a-Chip Designs . Norwell, MA: Kluwer Academic Publishers, 1999.

11. F. Nekoogar. Timing Verification of Application Specific Circuits (ASICs) . Upper Saddle River, NJ: Prentice Hall PTR, 1999.

12. Spring Tech Seminars, Verification 2001, Synopsys, Inc., Mountain View, CA.

13. ASIC Products Application Notes. "Application of Synopsys Physical Compiler in IBM ASIC Methodology." IBM, August 2001.

14. ASIC Products Application Notes. "Application of Cadence Envisia PKS in IBM ASIC Methodology." IBM, May 2001.

15. CMOS ASIC CS81/CE81 Series, Product information notes. Fujitsu, March 2000.

16. "FPGA to ASIC Conversion Program." Epson Electronics America, Inc., November 2000.

17. www.amis.com/conversion

18. "Hierarchical Static Timing Analysis Using Interface Logic Models, PrimeTime." Synopsys, Inc., Mountain View, CA, January 2001.

19. "Best Practices and Advanced Verification Techniques." Spring Tech Seminars, Verification 2001, Synopsys, Inc., Mountain View, CA.

20. "Complete Best-in-Class Synthesis Solution." Spring Tech Seminars, Synthesis 2001, Synopsis, Inc., Mountain View, CA.

21. www.cadence.com/ datasheets /assertion_based_verification.html

22. www.cadence.com/products/fv.html

23. N. Deo. "Tools and Technologies for Deep Submicron IC Design." 1997.


   
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From ASICs to SOCs. A Practical Approach
From ASICs to SOCs: A Practical Approach
ISBN: 0130338575
EAN: 2147483647
Year: 2003
Pages: 61

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