10.9 References

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Roberts, G. W.: ‘Metrics, techniques, and recent developments in mixed-signal testing’, Digest of technical papers. IEEE International Conference on Computer-Aided Design, San Jose, 1996, pp. 10–14
Razavi, B.: ‘RF microelectronics’ (Prentice Hall, Englewood Cliffs, New Jersey, 1998)
Kenington, P. B.: ‘Emerging technologies for software radio’, IEE Electronics and Communication Engineering Journal, April 1999, 11 (2), pp. 69–83
Burns, M. and Roberts, G. W.: ‘An introduction to mixed-signal IC test and measurement’ (Oxford University Press, New York, 2001)
Milor, L. S.: ‘A tutorial introduction to research on analog and mixed-signal circuit testing’, IEEE Transactions on Circuits and Systems – II: Analog and Digital Signal Processing, October 1998, 45 (10), pp. 1389–407
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Milor, L. and Sangiovanni-Vincentelli, A. L.: ‘Minimizing production test time to detect faults in analog circuits’. IEEE Transactions on Computer-Aided Design of Integrated Circuits, June 1994, 13 (6), pp. 796–813
Milor, L. and Sangiovanni-Vincentelli, A. L.: ‘Optimal test set design for analog circuits’. Proceedings of IEEE International Conference on Computer-Aided Design, Santa Clara, 1990, pp. 294–97
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Roberts, G. W.: ‘Improving the testability of mixed-signal integrated circuits’. Proceedings of IEEE Custom Integrated Circuits Conference, Santa Clara, 1997, pp. 214–21
Hawrysh, E. M. and Roberts, G. W.: ‘An integration of memory-based analog signal generation into current DFT architectures’. Proceedings of IEEE International Test Conference, Washington, DC, 1996, pp. 528–37
Dufort, B. and Roberts, G. W.: ‘On-chip analog signal generation for mixed-signal built-in self-test’, IEEE Journal of Solid-State Circuits, March 1999, 34 (3), pp. 318–30
Mahoney, M. V.: ‘DSP-based testing of analog and mixed-signal circuits’ (IEEE Computer Society Press, Washington, DC, 1987)
Schreier, R.: ‘An empirical study of high-order single-bit delta-sigma modulators’, IEEE Transactions on Circuits and Systems – II: Analog and Digital Signal Processing, August 1993, 40 (8), pp. 461–6
Hafed, M., Abaskharoun, N. and Roberts, G. W.: ‘A 4-GHz effective sample-rate integrated test core for analog and mixed-signal circuits’, IEEE Journal of Solid-State Circuits, April 2002, 37 (4), pp. 499–514
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Hafed, M., Laberge, S. and Roberts, G. W.: ‘A robust deep submicron programmable DC voltage generator’. Proceedings of IEEE International Symposium on Circuits and Systems, Geneva, 2000, 4, pp. 5–8
Laberge, S.: ‘DC voltage generation using periodic bit-stream modulation’. Masters Thesis, McGill University, 2002
Hsieh, L. and Kumar, S. P.: ‘Digitizer error extraction in the nonlinearity test’. Proceedings of IEEE International Test Conference, Washington, DC, 1994, pp. 757–62
Song, B., Lee, S. and Tompsett, M.: ‘A 10-b 15-MHz CMOS recycling two-step A/D converter’, IEEE Journal of Solid-State Circuits, December 1990, 25 (6), pp. 1328–38
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Poulton, K., Neff, R., Muto, A., Liu, W., Burstein, A. and Heshami, M.: ‘A 4GSample/S 8b ADC in 0.35 μm CMOS’, Digest IEEE International Solid-State Circuits Conference, San Francisco, 2002, pp. 166–67
Kulp, B. D.: ‘Testing and characterizing jitter in 100 Base-Tx and 155.52 Mbits/s ATM devices with 1 Gsample/s AWG in an ATE system'. Proceedings of IEEE International Test Conference, Washington, DC, 1996, pp. 104–11
Abaskharoun, N., Hafed, M. and Roberts, G. W.: ‘Strategies for on-chip sub-nanosecond signal capture and timing measurement’. Proceedings of IEEE International Symposium on Circuits and Systems, Sydney, 2001, 4, pp. 174–77