10.8 Conclusions


10.8 Conclusions

In this chapter, some of the techniques, challenges and recent developments in the test and characterisation of RF, analogue, and mixed-signal circuits have been described. Specifically, present test techniques were introduced and shown to rely on direct access methods using external test equipment. These methods require the synchronisation of different pieces of measurement apparatus and rely on excessively long interconnection media for electronic signal delivery to/from the device being tested. Such a measurement paradigm is becoming increasingly infeasible as modern mixed-signal devices continue to require tight measurement specifications and higher test signal bandwidths while offering a reduced number of interface pins for direct external access. Thus, although clever test list ordering and optimisation can be employed, some fundamental changes to test access methods have to be sought. To tackle this problem, this chapter introduced new techniques that can significantly enhance the testability and diagnostic ability of mixed-signal integrated circuits. At the heart of these techniques is a highly robust, compact, scalable and easily synthesisable embedded test core that emulates the functions of fully-fledged production-phase automatic test equipment. The integration of such a core represents a radical change from the present test practice; however, it is envisioned to provide a practical solution to an impending problem facing the semiconductor industry.




Wireless Communication Circuits and Systems
Wireless Communications Circuits and Systems (IEE Circuits, Devices and Systems Series 16)
ISBN: 0852964439
EAN: 2147483647
Year: 2004
Pages: 100
Authors: Yichuang Sun

flylib.com © 2008-2017.
If you may any questions please contact us: flylib@qtcs.net