Six Sigma and Beyond - Statistical Process Control, Volume IV


D. H. Stamatis
ST. LUCIE PRESS A CRC Press Company
Boca Raton London New York Washington, D.C.

Library of Congress Cataloging-in-Publication Data

 Stamatis, D. H., 1947-    Six sigma and beyond : statistical process control, volume IV           p.  cm. -- (Six sigma and beyond series)    Includes bibliographical references. 
ISBN 1-57444-313-5 (v. 1 : alk paper)

1. Quality control--Statistical methods . 2. Production management--Statistical methods. 3. Industrial management. I. Title. II. Series.

TS156 .S73 2001

658.5'62--dc21 2001041635

This book contains information obtained from authentic and highly regarded sources. Reprinted material is quoted with permission, and sources are indicated. A wide variety of references are listed. Reasonable efforts have been made to publish reliable data and information, but the author and the publisher cannot assume responsibility for the validity of all materials or for the consequences of their use.

Neither this book nor any part may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopying, microfilming, and recording, or by any information storage or retrieval system, without prior permission in writing from the publisher.

The consent of CRC Press LLC does not extend to copying for general distribution, for promotion, for creating new works, or for resale. Specific permission must be obtained in writing from CRC Press LLC for such copying.

Direct all inquiries to CRC Press LLC, 2000 N.W. Corporate Blvd., Boca Raton, Florida 33431.

Trademark Notice: Product or corporate names may be trademarks or registered trademarks, and are used only for identification and explanation, without intent to infringe.

Visit the CRC Press Web site at www.crepress.com

Copyright 2003 by CRC Press LLC

St. Lucie Press is an imprint of CRC Press LLC

No claim to original U.S. Government works

International Standard Book Number 1-57444-313-5

Library of Congress Card Number 2001041635

Printed in the United States of America 1 2 3 4 5 6 7 8 9 0

Printed on acid-free paper

To Jamey

About the Author

D. H. Stamatis, Ph.D., ASQC-Fellow, CQE, CMfgE, is currently president of Contemporary Consultants in Southgate, Michigan. He received his B.S. and B.A. degrees in marketing from Wayne State University, his Master's degree from Central Michigan University, and his Ph.D. degree in instructional technology and business/statistics from Wayne State University.

Dr. Stamatis is a certified quality engineer for the American Society of Quality Control, a certified manufacturing engineer for the Society of Manufacturing Engineers, and a graduate of BSIIs ISO 9000 lead assessor training program.

He is a specialist in management consulting, organizational development, and quality science and has taught these subjects at Central Michigan University, the University of Michigan, and Florida Institute of Technology.

With more than 30 years of experience in management, quality training, and consulting, Dr. Stamatis has served and consulted for numerous industries in the private and public sectors. His consulting extends across the United States, Southeast Asia, Japan, China, India, and Europe. Dr. Stamatis has written more than 60 articles, and presented many speeches at national and international conferences on quality. He is a contributing author in several books and the sole author of 20 books. In addition, he has performed more than 100 automotive- related audits and 25 preassessment ISO 9000 audits , and has helped several companies attain certification. He is an active member of the Detroit Engineering Society, the American Society for Training and Development, the American Marketing Association, and the American Research Association, and a fellow of the American Society for Quality Control.

Acknowledgments

When I first thought of writing the series on the Six Sigma, I believed that the topic of statistical process control (SPC), and this volume especially , would be the easiest of them all. Yet, I found it challenging because many books have been written on the topic, some better than others; and frustrating because there is so much information one can write about on this very topic. For example, where do you draw the line on content for the need for improvement, summarizing data, sampling, problem solving, and so on?

As frustrating as the undertaking of this volume was, it made me realize how fortunate I am to have friends , colleagues, and individuals who were willing to help me define the scope of the book, review several drafts, and suggest not only technical content but flow of the information.

The list for appreciation is so great that I am sure I will not remember all the individuals who have helped in this final work. However, if I miss anyone , please know that I am appreciative of your willingness to help and to suggest better ideas.

By far the most helpful individual who was my sounding board for technical as well as nontechnical information was Dr. R. Munro of Ford Motor Company, followed by E. Rice, also of Ford Motor Company. Their challenging questions and provocative thoughts have made this volume a better product than it could have been without their contributions.

Next on my list is Stephen Stamatis, a chemical engineering student at the University of Michigan who diligently devoted many hours checking the formulas and generating the tables for the z-score (both traditional and the six sigma), t-distribution , F-distribution, and the table for checking the runs. (The table of runs is a regurgitation of the work that Shapiro and Wilks did in 1965 and published in Biometrica .)

How can I forget the endless discussions with Dr. R. Kapur and Dr. R. Roy about specific topics of SPC and their inclusion on this volume?

Thanks also go to R. Rossier, Manager of Ford Design Institute, Ford Motor Company, for helping in securing permission of the Global 8D questions. Without his tireless effort, this volume and Volume II would have been short-changed.

Special thanks go to V. Lowe for the endless discussions on the topics of capability and measurement error. Vick, believe it or not, I really learned a lot from you and I have tried to incorporate that knowledge as much as possible into the chapters dealing with these topics.

And I cannot forget the opportunity that the following individuals gave me to practice some of the principles of SPC in their companies. They are B. Johnston, Technical Marketing Manager, M. Brethauer, Technical Marketing, and S. Hall, Manufacturing Engineering ” Project Manager, all three of Hewlett Packard; A. Satsangi, Factory Operations Executive Manufacturing Industry at IBM; R. Wendle, Training Specialist at Lafarge Corporation; O. Gabis, Quality Manager at ORMET Corporation; J. LaMonica, Plant Manager at Grayhill, Inc.; G. Turner, Director of Quality at Teledyne Water Pik; J. Pierce, Manager-Coal Preparation and Quality Assurance at U.S. Steel Mining Co. Inc.; and B. Jorgensen, Quality Engineer at ICM/Krebsoge.

Others who have helped are J. Malicki, G. Mooridian, H. Jamal, and Michelle Ruhle, for typing and reviewing some of the earlier drafts.

Technical colleagues who helped me formalize the content to its present format through either direct suggestions or through conversations about specific topics are W. Winchell, C. Girard, K. Wolf, B. Granzow, Gene Tomlison, D. Wall, G. Burke, R. Morrissett, M. Reaperhouse, M. Tolbert, W. MacCarthy, R. Read, L. Scott, M. Holmberg, G. Woodley, G. Heaventhal, Dr. L. Nickerback, and Dr. S. Childs. I thank them for their patience and sound recommendations. It is through their direct or indirect input that they made a difference in the final version of this volume.

How can I forget the tireless Wong Chin Hak, who was constantly reminding me that concepts without pictures in the technical domain are difficult to communicate. It is through his diligence and perseverance that so many figures have been included in this volume. In retrospect, I believe he was correct. The figures do indeed bring home the ideas and concepts discussed. Thanks, Chin.

I am grateful for the prodding of Dr. P Votsis and Dr. J. Angeli from the Cyprus Organization for Standards and Control of Quality and The Institute of Research Promotion (of Cyprus), respectively, who kept reminding me to write something practical, easy to follow, and at the same time advanced text or "something" in the area of SPC. The early conversations in New Delhi, India followed by the conversations in Jerusalem, Israel and Athens, Greece finally produced an outline that turned out to be the fourth volume of this series. Friends, both of you are incredible and persuasive. Thanks for keeping up the pressure and faith in me. I hope you like the final product.

Thanks also go to the thousands of participants who have sat through my public seminars getting the flavor of the book first-hand. Their recommendations were heard and incorporated in this final version.

I also want to thank the editors of the series for an excellent job in editing and formatting the book. Their suggestions have made a difference.

Finally, my gratitude and thanks go, as usual, to my partner and best friend ”my wife, Carla. Thanks, dear, for putting up with me. I know in my effort to complete this work, I have neglected to do other things, like replace light fixtures, replace shelves , and you know the rest. It is not that I do not care ”it is because I am always running out of time.




Six Sigma and Beyond. Statistical Process Control (Vol. 4)
Six Sigma and Beyond: Statistical Process Control, Volume IV
ISBN: 1574443135
EAN: 2147483647
Year: 2003
Pages: 181
Authors: D.H. Stamatis

flylib.com © 2008-2017.
If you may any questions please contact us: flylib@qtcs.net